半導体製造ラボ

conference research / Tier b

JSSRR Annual Meeting学会研究

Synchrotron radiation science and beamline research covering light sources, beamline and detector systems, XFEL, VUV/soft X-ray and X-ray spectroscopy, diffraction/scattering, imaging, XAFS, infrared/terahertz, biological applications, industrial use, and facility reports. Relevant to semiconductor materials analysis, surface/interface characterization, thin films, device materials, metrology, and process-control research.

日本放射光学会年会・放射光科学合同シンポジウム / Japanese Society for Synchrotron Radiation Research Annual Meeting and Joint Symposium in Synchrotron Radiation Scienceは、ロジック / デバイス / プロセス統合の観点から JSSRR Annual Meeting, synchrotron radiation science, XAFS, diffraction and scattering, imaging, surface/interface spectroscopy, industrial use, beamline instrumentation, official committee mix, visible first-listed affiliation sample, and official exhibitor rows を確認するための学会です。公式ページ、募集要項、program、proceedings を分けて確認し、研究室DBや求人DBの分類軸へ接続します。

snapshot

基本データ

Tier B

3大国際会議以外の主要学会として、分野別に確認する。

分野 ロジック / デバイス / プロセス統合

研究室DBと技術レーダーのfield接続に使う。

ジャンル FEOL / デバイス / BEOL / 配線・製造 / フォトニクス

FEOL、BEOL、3DI、回路、WBG、フォトニクス、信頼性へ接続する。

主催 The Japanese Society for Synchrotron Radiation Research
開催サイクル 2025-01-10 to 2025-01-12 / Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan

2025 completed cycle / official Confit completed-cycle announcement, organization page, public search/session pages, full exhibitor listing, co-host listing, and 2026 current-cycle context checked

投稿形式 Official JSSRR 2025 Confit pages identify oral, poster, and facility-report presentations for the completed cycle. Reviewed public graph data is hydrated from PostgreSQL researchVisualSignals.

topics

研究テーマと企業調査へ変換する

coverage

Synchrotron radiation science and beamline research covering light sources, beamline and detector systems, XFEL, VUV/soft X-ray and X-ray spectroscopy, diffraction/scattering, imaging, XAFS, infrared/terahertz, biological applications, industrial use, and facility reports. Relevant to semiconductor materials analysis, surface/interface characterization, thin films, device materials, metrology, and process-control research.

監視テーマ

JSSRR Annual Meeting, synchrotron radiation science, XAFS, diffraction and scattering, imaging, surface/interface spectroscopy, industrial use, beamline instrumentation, official committee mix, visible first-listed affiliation sample, and official exhibitor rows

CFPから抽出する論点

Official JSSRR 2025 sources identify the January 10-12, 2025 Tsukuba cycle, completed-cycle counts, organization committee rows, public session/presentation rows, full official exhibitor listing, co-host organizations, and current-cycle context from JSSRR 2026.

年次比較で残す比較軸

Official Confit pages show the completed JSSRR 2025 cycle and the later JSSRR 2026 cycle; the graph records completed-cycle/current-cycle evidence without inferring a first-held year.

deadlines

投稿・採択イベント

要旨締切 2025-01-10

2025 completed cycle / official Confit completed-cycle announcement, organization page, public search/session pages, full exhibitor listing, co-host listing, and 2026 current-cycle context checked

最終原稿締切 2025-01-12

2025 completed cycle / official Confit completed-cycle announcement, organization page, public search/session pages, full exhibitor listing, co-host listing, and 2026 current-cycle context checked

related pages

関連ページ

締切一覧で全体比較 研究室DBで発表実績タグを確認 学会記事トレンド 技術レーダー

研究室DBの学会発表実績タグは、公式業績・program・researchmap/KAKEN成果などで実際の発表が確認できた場合だけ表示します。候補・近接テーマだけでは接続しません。

sources

公式確認リンク